DocumentCode :
1636125
Title :
Fuzzy biasless simulated evolution for multiobjective VLSI placement
Author :
Khan, Junaid A. ; Sait, Sadiq M. ; Minhas, Mahmood R.
Author_Institution :
Dept. of Electr. & Comput. Eng., British Columbia Univ., Vancouver, BC, Canada
Volume :
2
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
1642
Lastpage :
1647
Abstract :
In each iteration of a simulated evolution (SE) algorithm for VLSI placement, poorly placed cells are selected probabilistically, based on a measure known as ´goodness´. To compensate for the error in the goodness calculation (and to maintain the number of selected cells within some limit), a parameter known as ´bias´ is used, which has major impact on the algorithm´s run-time and on the quality of the solution subspace searched. However, it is difficult to select the appropriate value of this selection bias because it varies for each problem instance. In this paper, a biasless selection scheme for the SE algorithm is proposed. This scheme eliminates the human interaction needed in the selection of the bias value for each problem instance. Due to the imprecise nature of the design information at the placement stage, fuzzy logic is used in all stages of the SE algorithm. The proposed scheme was compared with an adaptive bias scheme and was always able to achieve better solutions
Keywords :
VLSI; circuit layout CAD; circuit optimisation; circuit simulation; error compensation; evolutionary computation; fuzzy logic; heuristic programming; integrated circuit layout; iterative methods; search problems; adaptive bias scheme; algorithm run-time; biasless selection scheme; fuzzy biasless simulated evolution; fuzzy logic; goodness calculation error compensation; goodness measure; imprecise design information; iteration; multi-objective VLSI placement; poorly placed cell selection; probabilistic selection; problem instances; selection bias parameter; simulated evolution algorithm; solution quality; solution subspace searching; Algorithm design and analysis; Computational modeling; Computer errors; Computer simulation; Electric variables measurement; Fuzzy logic; Minerals; Petroleum; Runtime; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Evolutionary Computation, 2002. CEC '02. Proceedings of the 2002 Congress on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-7282-4
Type :
conf
DOI :
10.1109/CEC.2002.1004488
Filename :
1004488
Link To Document :
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