• DocumentCode
    163616
  • Title

    Novel processing for access resistance reduction in Germanium devices

  • Author

    Duffy, Ray ; Shayesteh, Maryam

  • Author_Institution
    Tyndall Nat. Inst., Univ. Coll. Cork, Cork, Ireland
  • fYear
    2014
  • fDate
    18-20 May 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper reviews the experimental state-of-the-art in access resistance reduction in Ge devices. Special attention is paid to the doping and thermal annealing state-of-the-art, highlighting in particular those techniques that have been applied to Si devices, but have not yet been properly optimised in Ge. We also look forward to emerging novel processes for access resistance reduction.
  • Keywords
    MIS devices; annealing; elemental semiconductors; germanium; semiconductor doping; silicon; Ge; Si; Si devices; access resistance reduction; doping; germanium devices; thermal annealing; Annealing; Doping; FinFETs; Implants; Resistance; Silicon; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Junction Technology (IWJT), 2014 International Workshop on
  • Conference_Location
    Shanghai
  • Type

    conf

  • DOI
    10.1109/IWJT.2014.6842051
  • Filename
    6842051