Title :
Novel processing for access resistance reduction in Germanium devices
Author :
Duffy, Ray ; Shayesteh, Maryam
Author_Institution :
Tyndall Nat. Inst., Univ. Coll. Cork, Cork, Ireland
Abstract :
This paper reviews the experimental state-of-the-art in access resistance reduction in Ge devices. Special attention is paid to the doping and thermal annealing state-of-the-art, highlighting in particular those techniques that have been applied to Si devices, but have not yet been properly optimised in Ge. We also look forward to emerging novel processes for access resistance reduction.
Keywords :
MIS devices; annealing; elemental semiconductors; germanium; semiconductor doping; silicon; Ge; Si; Si devices; access resistance reduction; doping; germanium devices; thermal annealing; Annealing; Doping; FinFETs; Implants; Resistance; Silicon; Substrates;
Conference_Titel :
Junction Technology (IWJT), 2014 International Workshop on
Conference_Location :
Shanghai
DOI :
10.1109/IWJT.2014.6842051