DocumentCode
163616
Title
Novel processing for access resistance reduction in Germanium devices
Author
Duffy, Ray ; Shayesteh, Maryam
Author_Institution
Tyndall Nat. Inst., Univ. Coll. Cork, Cork, Ireland
fYear
2014
fDate
18-20 May 2014
Firstpage
1
Lastpage
6
Abstract
This paper reviews the experimental state-of-the-art in access resistance reduction in Ge devices. Special attention is paid to the doping and thermal annealing state-of-the-art, highlighting in particular those techniques that have been applied to Si devices, but have not yet been properly optimised in Ge. We also look forward to emerging novel processes for access resistance reduction.
Keywords
MIS devices; annealing; elemental semiconductors; germanium; semiconductor doping; silicon; Ge; Si; Si devices; access resistance reduction; doping; germanium devices; thermal annealing; Annealing; Doping; FinFETs; Implants; Resistance; Silicon; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Junction Technology (IWJT), 2014 International Workshop on
Conference_Location
Shanghai
Type
conf
DOI
10.1109/IWJT.2014.6842051
Filename
6842051
Link To Document