Title :
Non-ideality analysis of clock-jitter suppressing sampler for wideband /spl Sigma//spl Delta/ analog-to-digital converters
Author :
Strak, A. ; Tenhunen, H.
Author_Institution :
Lab. of Electron. & Comput. Syst., R. Inst. of Technol., Kista, Sweden
Abstract :
As CMOS processes evolve into smaller and smaller feature sizes, the ability to clock circuits at higher rates and the need of integrating analog and digital systems on a single chip arises. This makes it suitable to use a wideband /spl Sigma//spl Delta/ Analog-to-Digital Converter (ADC), due to its high digital content and robustness against circuit imperfections, as part of a front end for a 3/sup rd/ or 4/sup th/ generation mobile communications system. One type of EA that would be appropriate for such an application is suggested by Rusu and Tenhunen (2002). However, wideband operation sets tough jitter constraints on the clock since the oversampling ratio (OSR) is lower than for traditional /spl Sigma//spl Delta/ ADCs. Previously, we have proposed a sampling circuit topology which helps to reduce the effects of non-uniform sampling by averaging. This topology´s jitter suppressing properties are based on certain assumptions which, in reality, are non-ideal. This paper describes an analysis of those nonidealities and their impact on the topology´s jitter suppressing features on a circuit level.
Keywords :
CMOS integrated circuits; delay lines; network topology; sigma-delta modulation; signal sampling; switched capacitor networks; timing jitter; CMOS processes; SC topology; averaging; clock-jitter suppressing sampler; jitter constraints; mobile communications system front end; nonideality analysis; nonuniform sampling; oversampling ratio; sampling circuit topology; wideband /spl Sigma//spl Delta/ ADCs; wideband analog-to-digital converters; Analog-digital conversion; CMOS process; Circuit topology; Clocks; Digital systems; Jitter; Mobile communication; Robustness; Sampling methods; Wideband;
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7695-1
DOI :
10.1109/MWSYM.2003.1211039