Title :
Joint Frequency-Domain Differential Detection and Equalization for 2-Dimensional Spread/Chip-Interleaved DS-CDMA Uplink Transmissions
Author :
Liu, Le ; Adachi, Fumiyuki
Author_Institution :
Dept. of Electr. & Commun. Eng., Tohoku Univ., Sendai
Abstract :
The multiple-access interference (MAI) limits the performance of the DS-CDMA uplink transmission. 2 dimensional (2D) spread/chip-interleaved DS-CDMA is an MAI-free system, where single-user coherent frequency- domain equalization (FDE) can be used instead of complicated multiuser detection (MUD). However, coherent FDE needs channel estimation. Pilot-assisted channel estimation is not reliable in a fast fading environment. In this paper, we apply joint frequency- domain differential detection and equalization (FDDDE) that requires no channel estimation to 2D spread/chip- interleaved DS-CDMA in a multiuser/multipath environment. The filter coefficient used in FDDDE is updated by estimating the normalized Doppler frequency. Computer simulation results show that 2D spread/chip- interleaved DS-CDMA using FDDDE is robust against fast fading.
Keywords :
Doppler shift; channel estimation; code division multiple access; equalisers; fading channels; frequency-domain analysis; interleaved codes; multipath channels; multiuser channels; radiofrequency interference; signal detection; spread spectrum communication; 2-dimensional spread-chip- interleaved transmissions; DS-CDMA uplink transmissions; computer simulation; fast fading environment; filter coefficient; joint frequency-domain differential detection; multiple-access interference; multiuser detection; multiuser-multipath environment; normalized Doppler frequency; pilot-assisted channel estimation; single-user coherent frequency-domain equalization; Bit error rate; Channel estimation; Computer simulation; Fading; Frequency estimation; Interleaved codes; Multiaccess communication; Multiple access interference; Multiuser detection; Robustness;
Conference_Titel :
Vehicular Technology Conference, 2006. VTC-2006 Fall. 2006 IEEE 64th
Conference_Location :
Montreal, Que.
Print_ISBN :
1-4244-0062-7
Electronic_ISBN :
1-4244-0063-5
DOI :
10.1109/VTCF.2006.369