DocumentCode :
1636286
Title :
Influence of switching regimes on dielectric strength of high current triggered vacuum switches
Author :
Sidorov, V.A. ; Alferov, Dmitry F. ; Korobova, N.I.
Author_Institution :
Electrotech. Inst., Moscow, Russia
Volume :
2
fYear :
1999
Firstpage :
1254
Abstract :
Switching conditions influence on dielectric strength of internal insulation of high-current triggered vacuum switches with trapezoidal-rod electrode system is investigated. Investigations were carried out for two switching regimes. In the first regime electrode erosion occurs mainly in a vapor phase where the electrode surface remains smooth after switching. In the other switching regime a drop phase of electrode erosion prevails and considerable electrode surface damage takes place. It follows from statistical processing of experimental data that the breakdown voltage distribution is described with a Weibull distribution law satisfactorily. Influence of gap and electrode material on dielectric strength of triggered vacuum switches is considered.
Keywords :
Weibull distribution; electric strength; electrodes; switching; vacuum switches; Weibull distribution law; breakdown voltage distribution; dielectric strength; drop phase; electrode erosion; electrode surface; electrode surface damage; high current triggered vacuum switches; internal insulation; statistical processing; switching regime; switching regimes; trapezoidal-rod electrode; triggered vacuum switches; vapor phase; Capacitors; Copper; Dielectric breakdown; Dielectric measurements; Electrodes; Switches; Testing; Vacuum arcs; Vacuum breakdown; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-5498-2
Type :
conf
DOI :
10.1109/PPC.1999.823752
Filename :
823752
Link To Document :
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