• DocumentCode
    1636352
  • Title

    Determination of surface roughness from scattered light

  • Author

    Marx, Egon ; Cao, L.X. ; Vorburger, T.V.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • fYear
    1989
  • Firstpage
    192
  • Abstract
    The authors describe the determination of the root-mean-square (RMS) roughness of hand-lapped stainless steel specimens using the scattered intensity measured by a set of detectors spaced along a circular arc. The ratio between the specular beam and the total scattered light intensity is used to determine the RMS roughness. The authors explain what information is obtained from surface profiles taken with a stylus instrument and from light scattering data taken by the DALLAS instrument. Using an approximate scalar theory of electromagnetic scattering by random rough surfaces they compute the intensity of the scattered beam as a function of angle. They discuss the choice of autocorrelation function for the surface and do a least-squares fit for the parameters that characterize the surface. Results of the calculations are given.<>
  • Keywords
    light scattering; surface topography; DALLAS instrument; RMS roughness; angle; approximate scalar theory; autocorrelation function; detectors; electromagnetic scattering; hand-lapped stainless steel specimens; least-squares fit; scattered intensity; scattered light; specular beam; stylus instrument; surface profiles; surface roughness; Autocorrelation; Beams; Detectors; Electromagnetic scattering; Instruments; Light scattering; Rough surfaces; Steel; Surface fitting; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 1989. AP-S. Digest
  • Conference_Location
    San Jose, CA, USA
  • Type

    conf

  • DOI
    10.1109/APS.1989.134647
  • Filename
    134647