Title :
Reducing phase noise by proper sizing of MOSFETs in LC tuned VCOs
Author :
Ye-Ming Li ; Connelly, J.A.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This work identifies the relationships between the sizes of the oscillator´s core MOSFETs and the phase noise in the 1/f/sup 2/ region. Three packaged 1 GHz VCOs with the same LC tank circuit, but different gate lengths were designed and fabricated in a standard digital 0.6 /spl mu/m CMOS technology. The minimum gate length (L/sub min/) of the core MOSFETs does not result in the minimum phase noise. Instead, the minimum phase noise occurs when the gate length is L/sub opt/, and L/sub opt/ = /spl eta/ /spl middot/ L/sub min/ where /spl eta/ is a parameter that depends upon fabrication process and bias current. From measured results, the phase noise can be further decreased by 2 dBc/Hz at 600 kHz offset from 1 GHz center frequency by using the optimal sizes of the core MOSFETs.
Keywords :
MMIC oscillators; UHF integrated circuits; UHF oscillators; circuit tuning; field effect MMIC; phase noise; voltage-controlled oscillators; 0.6 micron; 1 GHz; 1/f/sup 2/ region; LC tank circuit; LC tuned VCOs; MOSFETs; bias current; fabrication process; gate lengths; phase noise; CMOS digital integrated circuits; CMOS technology; Fabrication; Frequency measurement; MOSFETs; Noise measurement; Optimized production technology; Packaging; Phase noise; Time of arrival estimation;
Conference_Titel :
Microwave Symposium Digest, 2003 IEEE MTT-S International
Conference_Location :
Philadelphia, PA, USA
Print_ISBN :
0-7803-7695-1
DOI :
10.1109/MWSYM.2003.1211047