DocumentCode :
163658
Title :
Silicon quantum dot devices for future electronics
Author :
Oda, Shoichiro
Author_Institution :
Quantum Nanoelectron. Res. Center, Tokyo Inst. of Technol., Tokyo, Japan
fYear :
2014
fDate :
12-14 May 2014
Firstpage :
13
Lastpage :
16
Abstract :
Quantum dot structures, where electrons are confined three-dimensionally in the below 10 nm scale, show characteristics quite different from conventional bulk structures. Recent progress in the fabrication technology of silicon nanostructures has made possible observations of novel electrical and optical properties of silicon quantum dots, such as single electron tunneling, ballistic transport, visible photoluminescence and electron emission. Silicon quantum dots are fabricated either by bottom-up or top-down processes. Fabrication and electrical characterization of Nanocrystalline Si films by plasma processes and coupled Si quantum dots by electron beam lithography processes are described.
Keywords :
ballistic transport; electron beam lithography; electron emission; elemental semiconductors; nanotechnology; photoluminescence; semiconductor quantum dots; silicon; tunnelling; ballistic transport; electron beam lithography; electron emission; nanocrystalline films; plasma processes; silicon nanostructures; silicon quantum dot devices; single electron tunneling; visible photoluminescence; Fabrication; Films; Logic gates; Plasmas; Quantum dots; Silicon; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-5295-3
Type :
conf
DOI :
10.1109/MIEL.2014.6842078
Filename :
6842078
Link To Document :
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