DocumentCode :
1636641
Title :
Comparative analysis of input parameters using wavelet transform for voltage sag disturbance classification
Author :
Ismail, Hanim ; Hamzah, Noraliza ; Shahbudin, Sharani ; Zakaria, Zuhaina
Author_Institution :
Fac. of Electr. Eng., Univ. Teknol. MARA, Shah Alam, Malaysia
fYear :
2010
Firstpage :
5
Lastpage :
8
Abstract :
Voltage sag is one of the major power quality disturbance today. Significant causes of voltage sag include power system fault, starting of induction motor and energizing of transformer. This paper focus on a comparative analysis carried out to determine the best input parameters to be employed in support vector machine (SVM) method for voltage sag cause classification. Wavelet transform is carried out to extract the feature of these voltage sags which are used as the input to the SVM. Two different types of inputs used, namely the energy level and the min-max values of the wavelet. Comparisons between these input parameters are made to determine the best method which give the best prediction values. Training and testing data based on the standard IEEE 30 bus distribution system are simulated using PSCAD software. The results show that the performance of the min-max wavelet values as the input to the SVM is superior than the energy level input in term of accuracy and computational time.
Keywords :
minimax techniques; power engineering computing; power supply quality; support vector machines; wavelet transforms; PSCAD software; SVM method; comparative analysis; induction motor; power quality disturbance; power system fault; power transformer; standard IEEE 30 bus distribution system; support vector machine; voltage sag disturbance classification; wavelet energy level; wavelet min-max values; wavelet transform; Feature extraction; Induction motors; Power quality; Support vector machines; Voltage fluctuations; Wavelet transforms; Support Vector Machine; Voltage Sag; Wavelet Transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering and Service Sciences (ICSESS), 2010 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-6054-0
Type :
conf
DOI :
10.1109/ICSESS.2010.5552350
Filename :
5552350
Link To Document :
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