DocumentCode
1636792
Title
Characterization of emitting carbon films
Author
Tolt, Z.L. ; Fink, R.L. ; Yaniv, Z.
Author_Institution
FEPET Inc., Austin, TX, USA
fYear
1998
Firstpage
226
Abstract
Summary form only given. Carbon films having low threshold extraction field, high emission site density and high emission current density were characterized by UV-Raman spectroscopy and high resolution atomic force microscopy (AFM). An hypothesis of the nature of emission sites in these films is proposed in accordance with the analyses.
Keywords
Raman spectra; atomic force microscopy; carbon; films; spectrochemical analysis; ultraviolet spectra; C; UV-Raman spectroscopy; emission sites; emitting C films; high emission current density; high emission site density; high resolution atomic force microscopy; low threshold extraction field; Atomic force microscopy; Carbon dioxide; Chemical industry; Chemical technology; Furnaces; Inductors; Plasma applications; Plasma chemistry; Plasma temperature; Power generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1998. 25th Anniversary. IEEE Conference Record - Abstracts. 1998 IEEE International on
Conference_Location
Raleigh, NC, USA
ISSN
0730-9244
Print_ISBN
0-7803-4792-7
Type
conf
DOI
10.1109/PLASMA.1998.677756
Filename
677756
Link To Document