Title :
Development of a new short-circuit tester for 1.7kV high current power devices
Author :
Maresca, L. ; Cardonia, M. ; Avallone, G. ; Riccio, M. ; Romano, Gianmarco ; De Falco, G. ; Irace, A. ; Breglio, G.
Author_Institution :
Dept. of Electr. Eng. & Inf. Technol., Univ. Federico II, Naples, Italy
Abstract :
The development of a new Short-Circuit (SC) tester for high current and high voltage power semiconductor devices is presented in this work. The proposed apparatus is provided with a Logical Control Unit (LCU) based on an FPGA digital circuit capable to control the system with 20ns programmable time resolution. The power side of the SC tester presents a series switch (SW) used to prevent undesired failure of the Device Under Test (DUT) and a 2.2mF capacitor bank designed with an optimized layout to strongly reduce parasitic stray inductance. Galvanic isolation between logical circuit and power side of the SC tester is ensured by using a custom optical fibers communication interface. Experimental measurements performed on commercial Trench-IGBTs (T-IGBTs) have confirmed the capability of the developed system to deliver high current pulses under supply voltage up to 1.7 kV.
Keywords :
circuit testing; insulated gate bipolar transistors; logic circuits; power semiconductor devices; short-circuit currents; DUT; FPGA digital circuit; LCU; T-IGBT; Trench-IGBT; capacitor bank; device under test; galvanic isolation; high current power devices; high current pulses; high voltage power semiconductor devices; logical circuit; logical control unit; optical fibers communication interface; parasitic stray inductance; power side; programmable time resolution; series switch; short-circuit tester; time 20 ns; voltage 1.7 kV; Capacitors; Field programmable gate arrays; Inductance; Insulated gate bipolar transistors; Layout; Power semiconductor devices; Reliability;
Conference_Titel :
Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-5295-3
DOI :
10.1109/MIEL.2014.6842091
