• DocumentCode
    1636870
  • Title

    High-k III–V MOSFETs enabled by atomic layer deposition

  • Author

    Ye, Peide D.

  • Author_Institution
    Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
  • fYear
    2010
  • Firstpage
    1302
  • Lastpage
    1302
  • Abstract
    The principal obstacle to III-V compound semiconductors rivaling or exceeding the properties of Si electronics has been the lack of high-quality, thermodynamically stable insulators on III-V materials. For more than four decades, the research community has searched for suitable III-V compound semiconductor gate dielectrics or passivation layers. The research on ALD approach is of particular interest, since the Si industry is getting familiar with ALD Hf-based dielectrics and this approach has the potential to become a manufacturable technology.
  • Keywords
    III-V semiconductors; MOSFET; atomic layer deposition; silicon; III-V compound semiconductors; MOSFET; atomic layer deposition; dielectrics; passivation layers; semiconductor gate dielectrics; thermodynamically stable insulators; Aluminum oxide; Dielectrics; High K dielectric materials; Indium gallium arsenide; Logic gates; MOSFETs; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-5797-7
  • Type

    conf

  • DOI
    10.1109/ICSICT.2010.5667644
  • Filename
    5667644