Title :
High-k III–V MOSFETs enabled by atomic layer deposition
Author_Institution :
Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
Abstract :
The principal obstacle to III-V compound semiconductors rivaling or exceeding the properties of Si electronics has been the lack of high-quality, thermodynamically stable insulators on III-V materials. For more than four decades, the research community has searched for suitable III-V compound semiconductor gate dielectrics or passivation layers. The research on ALD approach is of particular interest, since the Si industry is getting familiar with ALD Hf-based dielectrics and this approach has the potential to become a manufacturable technology.
Keywords :
III-V semiconductors; MOSFET; atomic layer deposition; silicon; III-V compound semiconductors; MOSFET; atomic layer deposition; dielectrics; passivation layers; semiconductor gate dielectrics; thermodynamically stable insulators; Aluminum oxide; Dielectrics; High K dielectric materials; Indium gallium arsenide; Logic gates; MOSFETs; Silicon;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
DOI :
10.1109/ICSICT.2010.5667644