Improving evolutionary algorithm performance on maximizing functional test coverage of ASICs using adaptation of the fitness criteria

Author

Aktan, Burcin ; Greenwood, Garrison ; Shor, Molly H.

Author_Institution

Network Processor Div., Intel Corp., Hudson, MA, USA

Volume

2

fYear

2002

fDate

6/24/1905 12:00:00 AM

Firstpage

1825

Lastpage

1829

Abstract

Adaptation of the fitness criteria can be a very powerful tool, enhancing the feedback scheme employed in standard evolutionary algorithms. When the problem the evolutionary algorithm (EA) is trying to solve is changing over time, the fitness criteria need to change to adapt to the new problem. Significant performance improvements are possible with feedback based adaptation schemes. This work outlines the results of an adaptation scheme applied to maximization of the functional test coverage problem

Keywords

adaptive systems; application specific integrated circuits; automatic test pattern generation; circuit analysis computing; evolutionary computation; feedback; integrated circuit testing; ASIC; adaptation fitness criteria; evolutionary algorithm performance improvement; feedback based adaptation schemes; functional test coverage maximization; Application specific integrated circuits; Automatic test equipment; Automatic testing; Circuit testing; Evolutionary computation; Feedback; Manufacturing; Pattern analysis; Protocols; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Evolutionary Computation, 2002. CEC '02. Proceedings of the 2002 Congress on

Conference_Location

Honolulu, HI

Print_ISBN

0-7803-7282-4

Type

conf

DOI

10.1109/CEC.2002.1004520

Filename

1004520