DocumentCode :
1636972
Title :
Electric aging of polyethylene in pulsed electric field
Author :
Boev, S.
Author_Institution :
High Voltage Res. Inst., Tomsk Polytech. Univ., Russia
Volume :
2
fYear :
1999
Firstpage :
1365
Abstract :
It is known that electric aging of polymer insulation in high pulse fields is a very intensive process which produces many problems. The breakdown after many pulse acts may be due to electric field modification because of the space charge storage or structure modification. Both reasons are discussed in this work for the case of pulse duration less than 1 ms. Space charge formation was studied using the pulse acoustic pressure method and the proton beam method. The results of measurements showed that the electric field modification because of space charge storage was not the main reason of short life time of polyethylene insulation. Electrons and holes injection from electrodes and their generation in volume of insulator are the reasons of structure aging, and, as a result, the breakdown voltage decreases. This conclusion is confirmed by the results of treeing formation at various voltage polarities and pulse duration.
Keywords :
XLPE insulation; acoustic intensity measurement; ageing; charge measurement; electric fields; impulse testing; insulation testing; proton beams; space charge; trees (electrical); breakdown voltage decrease; electric aging; electric field modification; electrons injection; high pulse fields; holes injection; insulator; polyethylene; polymer insulation; proton beam method; pulse acoustic pressure method; pulse duration; pulsed electric field; short life time; space charge formation; space charge storage; structure aging; structure modification; treeing formation; voltage polarities; Acoustic measurements; Acoustic pulses; Aging; Dielectrics and electrical insulation; Electric breakdown; Particle beams; Plastic insulation; Polyethylene; Polymers; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-5498-2
Type :
conf
DOI :
10.1109/PPC.1999.823781
Filename :
823781
Link To Document :
بازگشت