• DocumentCode
    1636980
  • Title

    Understanding HALT application in desktop, NB and Server

  • Author

    Hsu, Alvin ; Huang, Danny LS ; Chang, Gerald ; Yang, Jimmy

  • Author_Institution
    Wistron Corp., Hsinchu, Taiwan
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Application of HALT at design stage becomes more and more common in electronics industry. Many discussions and disputations of the HALT test interpretation are in full swing. With our HALT test experiences in notebook, desktop and server products, we intend to share and discuss the safety factor of exact product operating limits to its operation specifications in temperature and vibration and common failure modes stimulated thereby. A general perspective of the test setup techniques by product types and its influence is also provided. The distinctive roles of HALT on board level and system level from thermal flow field point of view are also shared in this paper.
  • Keywords
    life testing; reliability; HALT application; HALT test experience; HALT test interpretation; board level; desktop; electronics industry; highly accelerated life testing; safety factor; server products; system level; thermal flow; Niobium; Reliability engineering; Servers; Stress; Thermal stresses; Vibrations; Design Margin; Flow Field; HALT; Highly Accelerated Life Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2012 Proceedings - Annual
  • Conference_Location
    Reno, NV
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4577-1849-6
  • Type

    conf

  • DOI
    10.1109/RAMS.2012.6175460
  • Filename
    6175460