DocumentCode
1637203
Title
Reliability of k-out-of-n standby systems with gamma distributions
Author
Amari, Suprasad V.
Author_Institution
ASQ CRE, Parametric Technol. Corp., Greensburg, PA, USA
fYear
2012
Firstpage
1
Lastpage
6
Abstract
Cold standby redundancy is used as an effective mechanism for improving system reliability. However, methods for analyzing the reliability of k-out-of-n cold standby systems, particularly with components having age-dependent hazard (failure) rates, are limited. In this paper, using the concepts of counting processes, we propose an efficient method to evaluate the reliability of k-out-of-n cold standby systems. This proposed method considers gamma distributions for component lives and the effects of switch failures on system reliability. The main advantage of this counting process-based method is that it reduces a complex problem involving multiple integrals into an equivalent simple problem involving one-dimensional convolution integrals. We consider the gamma distribution for three reasons: (1) it can be used to model increasing, decreasing, and constant hazard rates, similar to the Weibull distribution, (2) it can be used to approximate several component failure time distributions, and (3) it has well established algorithms for calculating the convolutions that are used in the counting process-based method. In addition, we can find closed-form solutions to the convolution of the gamma distribution when its shape parameter is equal to an integer. Hence, we show that all steps involved in finding the reliability of k-out-of-n cold standby system are simple. We demonstrate the proposed method and its computational efficiency using a numerical example.
Keywords
Weibull distribution; consecutive system reliability; gamma distribution; Weibull distribution; age-dependent hazard rates; cold standby redundancy; component failure time distributions; component lives; counting process concept; counting process-based method; gamma distributions; k-out-of-n cold standby system reliability; one-dimensional convolution integrals; switch failure effect; Convolution; Equations; Mathematical model; Probability; Redundancy; Switches; cold standby redundancy; gamma distribution; k-out-of-n systems; reliability analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2012 Proceedings - Annual
Conference_Location
Reno, NV
ISSN
0149-144X
Print_ISBN
978-1-4577-1849-6
Type
conf
DOI
10.1109/RAMS.2012.6175471
Filename
6175471
Link To Document