Title :
Effect of PCB traces with continuous impedance perturbation on crosstalk immunity
Author :
Almalkawi, Mohammad ; Shamaileh, Khair ; Abushamleh, Said ; Choukiker, Yogesh ; Devabhaktuni, Vijay
Author_Institution :
Electr. Eng. & Comput. Sci. Dept., Univ. of Toledo, Toledo, OH, USA
Abstract :
In this paper, a non-uniform trace configuration to reduce crosstalk in printed circuit board (PCB) interconnects is investigated. The aim is to reduce crosstalk without incorporating additional PCB components in order to equalize propagation delays or modify inductive and capacitive couplings between the adjacent traces. This can be established by replacing a uniform victim trace on a PCB with a continuously varying-impedance trace that exhibits a lowpass filter (LPF) frequency characteristic. A simplified synthesis approach of the proposed trace impedance profile which is governed by a truncated Fourier series is presented. The proposed trace shows better crosstalk reduction results compared to conventional intervening guard trace schemes. Several configurations are discussed and the proposed non-uniform trace configuration is designed, implemented, and tested to demonstrate the improved crosstalk performance.
Keywords :
crosstalk; electric impedance; low-pass filters; printed circuit interconnections; PCB traces effect; capacitive couplings; continuous impedance perturbation; continuously varying-impedance trace; crosstalk immunity; crosstalk reduction; inductive couplings; lowpass filter frequency characteristic; nonuniform trace configuration; printed circuit board interconnects; propagation delays; simplified synthesis approach; trace impedance profile; truncated Fourier series; Couplings; Crosstalk; Cutoff frequency; Electromagnetic compatibility; Frequency modulation; Impedance; Printed circuits; Crosstalk; Fourier-based trace; electromagnetic compatibility (EMC); guard trace; lowpass filter (LPF); printed circuit board (PCB);
Conference_Titel :
Microwave and RF Conference, 2013 IEEE MTT-S International
Conference_Location :
New Delhi
DOI :
10.1109/IMaRC.2013.6777699