• DocumentCode
    1637622
  • Title

    An 18ns1mh Cmos Sram

  • Author

    Shimada, H. ; Tange, Y. ; Tanimoto, K. ; Shiraishi, M. ; Suzuki, N. ; Nomura, T.

  • Author_Institution
    Fujitsu MOS Memory Design Division, Kawasaki, Japan
  • fYear
    1988
  • Firstpage
    176
  • Keywords
    Aluminum; Capacitance; Circuit noise; Error analysis; Fluctuations; Frequency; Power dissipation; Random access memory; Read-write memory; Ring oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1988.663686
  • Filename
    663686
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1637622