DocumentCode
163768
Title
Dielectric powders X-ray crystallography using rietveld refinement
Author
Dobrescu, Lidia
Author_Institution
Dept. of Electron. Devices & Circuits, Politeh. Univ. of Bucharest, Bucharest, Romania
fYear
2014
fDate
12-14 May 2014
Firstpage
249
Lastpage
252
Abstract
This paper presents an accurate method to determine the atomic and molecular structure of crystal nanomaterials based on X-ray crystallography. Rietveld refinement using EXPO2009 Software has been applied to improve the results. Six different powder samples have been studied.
Keywords
X-ray crystallography; X-ray diffraction; dielectric materials; materials science computing; nanostructured materials; powders; EXPO2009 software; Rietveld refinement; X-ray crystallography; atomic structure; crystal nanomaterials; dielectric powders; molecular structure; Dielectrics; Diffraction; Lattices; Materials; Powders; X-ray diffraction; X-ray scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
Conference_Location
Belgrade
Print_ISBN
978-1-4799-5295-3
Type
conf
DOI
10.1109/MIEL.2014.6842134
Filename
6842134
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