• DocumentCode
    163776
  • Title

    Approximate analysis of optical properties for ZnO rough surfaces

  • Author

    Daliento, S. ; Guerriero, P. ; Addonizio, M. ; Antonaia, A.

  • Author_Institution
    Dept. of Electr. Eng. & Inf. Technol., Univ. of Naples, Naples, Italy
  • fYear
    2014
  • fDate
    12-14 May 2014
  • Firstpage
    261
  • Lastpage
    264
  • Abstract
    TCO (Transparent Conductive Oxides) layers often exhibit very rough surfaces and their optical properties, can not be described by one dimensional analytical models and numerical approaches must be adopted. However, computational time becomes, often, too large. In this paper we propose an automated procedure, based on the interaction between MATLAB and the Sentaurus TCAD environment which finds, in a generic rough surface, the smallest area characterized by the same statistical features of the whole surface so that full 3D analysis can be performed.
  • Keywords
    II-VI semiconductors; optical materials; optical properties; rough surfaces; zinc compounds; 3D analysis; Sentaurus TCAD environment; ZnO; optical properties; rough surfaces; statistical feature; transparent conductive oxide; Diffraction; MATLAB; Optical surface waves; Photovoltaic cells; Rough surfaces; Surface roughness; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
  • Conference_Location
    Belgrade
  • Print_ISBN
    978-1-4799-5295-3
  • Type

    conf

  • DOI
    10.1109/MIEL.2014.6842137
  • Filename
    6842137