• DocumentCode
    1637795
  • Title

    An 8ns Battery Back-Up Submicron Bicmos 256k Ecl Sram

  • Author

    Hiep V.Tran ; Scott, D.B. ; Kuen Fung ; Havemann, R. ; Eklund, R.E. ; Ham, T.E. ; Haken, R.A. ; Shah, A.H.

  • Author_Institution
    Texas Instruments Semiconductor Process and Design Center, Dallas, TX
  • fYear
    1988
  • Firstpage
    188
  • Keywords
    Batteries; BiCMOS integrated circuits; Capacitance; Decoding; Delay; Driver circuits; Independent component analysis; Instruments; Power dissipation; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1988.663692
  • Filename
    663692