Title :
An 8ns Battery Back-Up Submicron Bicmos 256k Ecl Sram
Author :
Hiep V.Tran ; Scott, D.B. ; Kuen Fung ; Havemann, R. ; Eklund, R.E. ; Ham, T.E. ; Haken, R.A. ; Shah, A.H.
Author_Institution :
Texas Instruments Semiconductor Process and Design Center, Dallas, TX
Keywords :
Batteries; BiCMOS integrated circuits; Capacitance; Decoding; Delay; Driver circuits; Independent component analysis; Instruments; Power dissipation; Random access memory;
Conference_Titel :
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1988.663692
