Title :
Improve the dynamic matching of the source-switching charge pump for high-performance phase-locked loops
Author :
Lan, Jinbao ; Gao, Zhiqiang ; Wang, Yuxin ; Liu, Lintao ; Li, Ruzhang
Author_Institution :
Sichuan Inst. of Solid State Circuits, CETC, Chongqing, China
Abstract :
Conventional source-switching charge pump suffers from slow turning-off speed and intrinsic speed mismatch between its NMOS discharging path and PMOS charging path, which incur obvious dynamic mismatch. To alleviate the above problems, this paper proposes an improved source-switching charge pump, which achieves much better dynamic matching while maintains the same static matching. The proposed charge pump outputs less current noise and lowers the reference spur obviously, which makes it quite preferable for high-performance phase-locked loops.
Keywords :
MOS integrated circuits; charge pump circuits; integrated circuit noise; phase locked loops; NMOS discharging path; PMOS charging path; current noise; dynamic matching; dynamic mismatch; high-performance phase-locked loops; intrinsic speed mismatch; reference spur; slow turning-off speed; source-switching charge pump; static matching; Capacitors; Charge pumps; MOSFETs; Noise; Phase locked loops; Voltage-controlled oscillators;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
DOI :
10.1109/ICSICT.2010.5667676