DocumentCode
1637949
Title
Spectral methods for logic design and testability
Author
Muzio, Jon C.
Author_Institution
Dept. of Comput. Sci., Victoria Univ., BC, Canada
fYear
1989
Firstpage
752
Abstract
A brief overview is presented of recent work in the application of the theory of Rademacher-Walsh transforms to fault detection, and analysis. The results are relevant both for the derivation of practical signatures for the testing of circuits and for the theoretical analysis of testing methods. The primary use is in compaction testing, using the coefficients as a possible test and using the transforms to derive deterministic values for the coverage of a test, without resorting to simulation
Keywords
fault location; logic design; logic testing; Rademacher-Walsh transforms; circuit testing; coefficients; compaction testing; deterministic values; fault analysis; fault detection; overview; practical signature derivation; test coverage; testing methods; theoretical analysis; Books; Circuit faults; Circuit testing; Compaction; Computer science; Design for testability; Fault detection; Logic design; Logic testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1989., IEEE International Symposium on
Conference_Location
Portland, OR
Type
conf
DOI
10.1109/ISCAS.1989.100460
Filename
100460
Link To Document