Title :
System on module total ionizing dose distribution modeling
Author :
Akhmetov, Alexey O. ; Boychenko, Dmitry V. ; Bobrovskiy, D.V. ; Chumakov, Alexander I. ; Kalashnikov, O.A. ; Nikiforov, Alexander Y. ; Nekrasov, Pavel V.
Author_Institution :
Nat. Res. Nucl. Univ., Moscow, Russia
Abstract :
The paper presents total ionizing dose (TID) distribution due to trapped electrons and protons at the system on module (SOM) surface. TID calculation was made in 3D_SPACE software (Specialized Electronic Systems). The main goal of this paper is a more precise definition of the radiation hardness requirements for space electronics. A huge TID level dispersion for different ICs in SOM is demonstrated. Basic Al sphere approach for TID spacecraft requirements calculations is shown to provide overestimated conservative results.
Keywords :
aluminium; radiation hardening (electronics); space vehicles; 3D_SPACE software; Al; Al sphere; SOM surface; TID distribution; TID level dispersion; TID spacecraft requirements; module total ionizing dose distribution; radiation hardness; space electronics; specialized electronic systems; system on module surface; trapped electrons; trapped protons; Orbits; Protons; Satellites; Software; Solid modeling; Space vehicles; Three-dimensional displays;
Conference_Titel :
Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on
Conference_Location :
Belgrade
Print_ISBN :
978-1-4799-5295-3
DOI :
10.1109/MIEL.2014.6842156
