Title :
A Twisted Bit Line Technique for Multi-Mb Drams
Author :
Yoshihara, T. ; Hidaka, H. ; Matsuda, Y. ; Fujishima, K.
Author_Institution :
Mitsubishi LSI Research and Development Laboratory, Itami, Japan
Keywords :
Capacitance; Feedback; Laboratories; Large scale integration; Mirrors; Noise cancellation; Noise figure; Noise reduction; Random access memory; Research and development;
Conference_Titel :
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1988.663708
