DocumentCode
1638149
Title
A Twisted Bit Line Technique for Multi-Mb Drams
Author
Yoshihara, T. ; Hidaka, H. ; Matsuda, Y. ; Fujishima, K.
Author_Institution
Mitsubishi LSI Research and Development Laboratory, Itami, Japan
fYear
1988
Firstpage
238
Lastpage
239
Keywords
Capacitance; Feedback; Laboratories; Large scale integration; Mirrors; Noise cancellation; Noise figure; Noise reduction; Random access memory; Research and development;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
Conference_Location
San Francisco, CA, USA
Type
conf
DOI
10.1109/ISSCC.1988.663708
Filename
663708
Link To Document