Title :
A 20ns 512kb Dram with 83mhz Page Operation
Author :
Lu, N.C.C. ; Hu Chao ; Wei Hwang ; Henkels ; Rajeevakumar ; Hanafi, H. ; German ; Franch, Robert
Author_Institution :
IBM Research Center, Yorktown Heights, NY
Keywords :
Chaos; Circuit noise; Content addressable storage; Decoding; Delay; Driver circuits; Noise reduction; Random access memory; Stress; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1988.663709
