• DocumentCode
    1638210
  • Title

    Design of reliable system based on Dynamic Bayesian Networks and Genetic Algorithm

  • Author

    Cao, Dingzhou ; Kan, Shaobai ; Sun, Yu

  • Author_Institution
    ReliaSoft Corp., Tucson, AZ, USA
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Traditional approaches to the design of a reliable system follow system requirement analysis, preliminary design, detail design, and evaluation and redesign phases until a final acceptable design is obtained. However, to achieve a shorter time to market, system reliability concerns should be addressed at the design stage (“design for reliability”). In this paper, we propose a reliability optimization framework based on Dynamic Bayesian Networks (DBN) and Genetic Algorithm (GA) which considers system reliability as a design parameter in design stages and can accelerate the design process of a reliable system. The majority of solution methods for reliability optimization problems are based on simple system structures (series, parallel, or k-out-of-n) without component dependency. In this paper, we extend it to a more complicated system with dynamic behavior. In order to capture the different dynamic behaviors of a system, DBN is used to estimate the system reliability of a potential design. Two basic DBN structures “CHOICE” and “REDUNDANCY” are introduced in this study. GA is developed and integrated into a DBN to find the optimal design. Simulation results show that the integration of GA optimization capabilities with DBN provides a robust, powerful system-design tool. Finally, the proposed method is applied to an example of a cardiac-assist system.
  • Keywords
    belief networks; design engineering; genetic algorithms; reliability theory; choice DBN structures; design for reliability; detail design; dynamic Bayesian networks; evaluation phase; genetic algorithm; preliminary design; redesign phase; redundancy DBN structures; reliability optimization framework; system reliability design; system requirement analysis; Genetic algorithms; Logic gates; Optimization; Power demand; Redundancy; Reliability engineering; Dynamic Bayesian Networks; Genetic Algorithm; Reliability optimization; System reliability modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2012 Proceedings - Annual
  • Conference_Location
    Reno, NV
  • ISSN
    0149-144X
  • Print_ISBN
    978-1-4577-1849-6
  • Type

    conf

  • DOI
    10.1109/RAMS.2012.6175505
  • Filename
    6175505