Title :
Fault diagnosis and repair of SoC memory
Author :
Litvinova, Eugenia ; Mostovaya, Karina ; Krasnoyarujskaya, Karina
Abstract :
Memory repair method by means of spares that enables to cover faulty cells by minimal quantity of reserved components was represented. It enables to increase yield rate (by 5-10 %) by means of repair of faulty silicon crystals on the manufacturing stage, as well as to increase life cycle time of silicon crystals during operation phase.
Keywords :
embedded systems; fault diagnosis; system-on-chip; SoC memory repair; fault diagnosis; silicon crystals; Built-In Repair Analysis; Fault Diagnosis; Memory repair;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2008 Proceedings of International Conference on
Conference_Location :
Lviv-Slavsko
Print_ISBN :
978-966-553-678-9
