Selecting input current waveforms using a hardware testing implementation incorporated in FPGAs

Author

Papakostas, D.K. ; Vassios, V. ; Pouros, S. ; Hatzopoulos, A.A.

Author_Institution

Dept. of Electron. Eng. T.E., Alexander Technol. Educ. Inst. of Thessaloniki, Thessaloniki, Greece

fYear

2014

fDate

12-14 May 2014

Firstpage

379

Lastpage

382

Abstract

The paper presents the comparison of waveforms for the input stimulus of a circuit under test, using a testing system incorporated in an FPGA, relying on a method based on wavelet transformation of the supply current or load current waveforms. The method differentiates due to the incorporation of different signal inputs according to the needs of the tester and the specifications of the circuit. This is a distinctive and effective method that offers a single-point test measurement solution and may easily be adapted to test various other analog and mixed-signal systems. Experimental results are presented showing the effectiveness of the proposed testing scheme.

Keywords

circuit testing; fault diagnosis; field programmable gate arrays; load (electric); wavelet transforms; FPGA; analog systems; circuit under test; hardware testing implementation; input current waveforms; input stimulus; load current waveforms; mixed-signal systems; signal inputs; single-point test measurement; wavelet transformation; Current measurement; Electrical fault detection; Fault detection; Field programmable gate arrays; Testing; Wavelet transforms;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronics Proceedings - MIEL 2014, 2014 29th International Conference on

Conference_Location

Belgrade

Print_ISBN

978-1-4799-5295-3

Type

conf

DOI

10.1109/MIEL.2014.6842169

Filename

6842169