DocumentCode :
1638410
Title :
An Experimental 16mb Dram with Transposed Data-Line Structure
Author :
Aoki, M. ; Nakagome, Y. ; Horiguchi, M. ; Ikenaga, S. ; Etoh, J. ; Kawamoto, Y. ; Kimura, S. ; Takeda, E. ; Sunami, H. ; Itoh, Kenji ; Tanaka, H.
Author_Institution :
Hitachi Central Research Laboratory, Tokyo, Japan
fYear :
1988
Firstpage :
250
Keywords :
Capacitance; Circuit noise; Integrated circuit noise; Interference; Noise cancellation; Noise figure; Noise generators; Random access memory; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
Conference_Location :
San Francisco, CA, USA
Type :
conf
DOI :
10.1109/ISSCC.1988.663714
Filename :
663714
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1638410
