• DocumentCode
    1638418
  • Title

    Method of critical distances for stochastic assessment of voltage sags in a meshed distribution system

  • Author

    Li, An ; Wen, Jinyu ; Iong, Inyin ; Xianggen Yin

  • Author_Institution
    Huazhong Univ. of Sci. & Technol., China
  • Volume
    3
  • fYear
    2004
  • Firstpage
    953
  • Abstract
    This paper is concerned with the method of critical distances for stochastic assessment of voltage sags in a large complicated distribution system. As the system is meshed, the method of critical distances is extended. Critical percentage of the feeders is developed from the critical distance in convenience to use the data provided by the industrial customer. The three phase short circuit faults in different locations, i.e. in the distribution system and in the public transmission system, are investigated detailed. The critical percentage of the feeders for each PCC is calculated. The results show that short circuit faults in the distribution system at 110 kV level will cause serious voltage sags, the spurious equipment trips are mainly due to the faults in the onsite system, not in the public utility system.
  • Keywords
    power distribution faults; power distribution protection; power supply quality; power transmission faults; short-circuit currents; stochastic processes; 110 kV; feeder; industrial customer; meshed distribution system; public transmission system; public utility system; spurious equipment trip; stochastic assessment; three phase short circuit fault; voltage sag; Circuit faults; Electronics industry; Gold; Impedance; Monitoring; Power electronics; Power quality; Stochastic processes; Stochastic systems; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Universities Power Engineering Conference, 2004. UPEC 2004. 39th International
  • Conference_Location
    Bristol, UK
  • Print_ISBN
    1-86043-365-0
  • Type

    conf

  • Filename
    1492166