DocumentCode
1638747
Title
Diagnostics based on faulty signature
Author
Chan, John C. ; Womack, Baxter
Author_Institution
IBM Corp., Austin, TX, USA
fYear
1989
Firstpage
935
Abstract
A fault diagnostic algorithm which makes use of the information from a faulty signature is presented. The idea is to search the likely fault locations before the tests are performed. The method reduces the number of tests required to diagnose the faults with the probability of error aliasing. Such probability is always smaller than that of error detection in signature analysis. When matching tests are difficult or impossible, the method provides an estimate of where errors that caused the incorrect signature might have occurred
Keywords
fault location; integrated circuit testing; logic testing; probability; IC testing; error aliasing; error detection; fault diagnostic algorithm; fault locations; faulty signature; logic testing; probability; signature analysis; Circuit faults; Circuit testing; Fault diagnosis; Fault location; Functional analysis; Information analysis; Input variables; Performance evaluation; Polynomials; Signal generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location
Washington, DC
Type
conf
DOI
10.1109/TEST.1989.82387
Filename
82387
Link To Document