DocumentCode :
1638801
Title :
Improved waveform-relaxation-Newton method [MOS circuit testing]
Author :
Klaassen, Bernhard ; Paap, Karl L. ; Ploeger, Paul G.
Author_Institution :
Gesellschaft fuer Math. und Datenverarbeitung, St. Augustin, West Germany
fYear :
1989
Firstpage :
856
Abstract :
After introducing the waveform relaxation (WR) concept, the authors briefly describe how WR was implemented in the simulator SISAL. They analyze a refinement of WR called waveform relaxation Newton (WRN). They reveal the interrelation of both methods and introduce an improved implementation technique of the WRN algorithm. Numerical results are reported
Keywords :
MOS integrated circuits; circuit analysis computing; integrated circuit testing; transient response; waveform analysis; IC testing; MOS circuits; SISAL simulator; improved implementation technique; transient analysis; waveform relaxation refinement; waveform-relaxation-Newton algorithm; waveform-relaxation-Newton method; Boolean functions; Circuit testing; Digital circuits; Feedback loop; Frequency; Gaussian processes; Hardware; Logic circuits; Nonlinear equations; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1989., IEEE International Symposium on
Conference_Location :
Portland, OR
Type :
conf
DOI :
10.1109/ISCAS.1989.100486
Filename :
100486
Link To Document :
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