• DocumentCode
    1639027
  • Title

    A background optimization method for PLL by measuring phase jitter performance

  • Author

    Dosho, Shiro ; Yanagisawa, Naoshi

  • Author_Institution
    Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
  • fYear
    2004
  • Firstpage
    236
  • Lastpage
    239
  • Abstract
    This paper describes a background (BG) optimization method for Phase-Locked-Loop(PLL). Measuring the phase shift of the voltage controlled oscillator(VCO) at each input reference clock, we can determine the phase jitter performance exactly. Using the combination of the global optimization method at initial phase and the local optimization method for background calibration always gives the PLL the smallest jitter performance under any conditions.
  • Keywords
    CMOS integrated circuits; integrated circuit measurement; jitter; phase locked loops; voltage-controlled oscillators; PLL; background optimization method; global optimization method; measuring phase jitter performance; phase jitter performance; phase shift; voltage controlled oscillator; Calibration; Charge pumps; Circuits; Clocks; Jitter; Optimization methods; Phase detection; Phase locked loops; Phase measurement; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on
  • Print_ISBN
    0-7803-8287-0
  • Type

    conf

  • DOI
    10.1109/VLSIC.2004.1346571
  • Filename
    1346571