DocumentCode
1639027
Title
A background optimization method for PLL by measuring phase jitter performance
Author
Dosho, Shiro ; Yanagisawa, Naoshi
Author_Institution
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
fYear
2004
Firstpage
236
Lastpage
239
Abstract
This paper describes a background (BG) optimization method for Phase-Locked-Loop(PLL). Measuring the phase shift of the voltage controlled oscillator(VCO) at each input reference clock, we can determine the phase jitter performance exactly. Using the combination of the global optimization method at initial phase and the local optimization method for background calibration always gives the PLL the smallest jitter performance under any conditions.
Keywords
CMOS integrated circuits; integrated circuit measurement; jitter; phase locked loops; voltage-controlled oscillators; PLL; background optimization method; global optimization method; measuring phase jitter performance; phase jitter performance; phase shift; voltage controlled oscillator; Calibration; Charge pumps; Circuits; Clocks; Jitter; Optimization methods; Phase detection; Phase locked loops; Phase measurement; Voltage-controlled oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 2004. Digest of Technical Papers. 2004 Symposium on
Print_ISBN
0-7803-8287-0
Type
conf
DOI
10.1109/VLSIC.2004.1346571
Filename
1346571
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