DocumentCode :
1639052
Title :
On the design of multiple-input shift-registers for signature analysis testing
Author :
Olivo, P. ; Damiani, M. ; Riccò, B.
Author_Institution :
DEIS, Bologna Univ., Italy
fYear :
1989
Firstpage :
936
Abstract :
Exact expressions for the aliasing error probability in multiple-input shift register for signature analysis testing are derived and used to obtain criteria for the optimal synthesis of signature registers. The register behavior is modeled under the assumption of statistical independence of error vectors from the circuit under test (CUT). A general solution to the resulting Markov chain is presented on the basis of an original coding theory technique that clarifies the effect of the major register features, as well as of the correlations among the CUT output bits. It is then possible to analyze in detail the most important design issues, such as the choice of the feedback polynomial and of the register optimal structure
Keywords :
Markov processes; error statistics; logic design; logic testing; polynomials; shift registers; Markov chain; coding theory; correlations; error probability; error vectors; feedback polynomial; logic design; multiple-input shift-registers; optimal synthesis; register optimal structure; signature analysis testing; signature registers; statistical independence; Circuit faults; Circuit synthesis; Circuit testing; Compaction; Computational Intelligence Society; Error correction; Error probability; Output feedback; Polynomials; Registers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/TEST.1989.82388
Filename :
82388
Link To Document :
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