DocumentCode :
1639240
Title :
Dielectric characteristics on insulation oil due to the aging by electron beam irradiation
Author :
Lee, Yong-Woo ; Kim, Ki-Taek ; Shin, Hyun-Taek ; Kim, Suk-Whan ; Hong, Jin-woong
Author_Institution :
Dept. of Electr. Eng., ChungNam Junior Coll., South Korea
Volume :
1
fYear :
1997
Firstpage :
170
Abstract :
The electron beam is used to change a nature of polymers in these days. When the transformer oils is irradiated with electron beam in order to investigate the dielectric characteristics, there is a morphological change. It has already confirmed that the high dose of electron beam is caused to increase the magnitude of dielectric dissipation factor, tanδ, which can be estimated to the insulation of specimen. So, in this experiment, a low dose of electron beam such as 0.5[Mrad], 1[Mrad], 2[Mrad] is irradiated. Tanδ is measured by Video Bridge 2150 in the applying voltage range 300[mV]~1500[mV], in the temperature range 20[°C]~120[°C], and in the frequency range 30[Hz]~1×105[Hz]. In addition to investigating the electrical properties of each specimen, the physical properties of each specimen is analyzed by using the FT-IR spectrum and the 1H-NMR spectrum
Keywords :
ageing; dielectric losses; electron beam effects; transformer oil; 0.5 to 2 Mrad; 20 to 120 C; 30 to 1E5 Hz; 300 to 1500 mV; 1H-NMR spectrum; FTIR spectrum; Video Bridge 2150; aging; dielectric characteristics; dielectric dissipation factor; electrical properties; electron beam irradiation; insulation oil; morphology; polymer; transformer oil; Aging; Bridge circuits; Dielectric measurements; Dielectrics and electrical insulation; Electron beams; Frequency measurement; Oil insulation; Petroleum; Polymers; Power transformer insulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-2651-2
Type :
conf
DOI :
10.1109/ICPADM.1997.617555
Filename :
617555
Link To Document :
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