Title :
TSG-a test system generator for debugging and regression test of high-level behavioral synthesis tools
Author :
Ernst, R. ; Sutarwala, S. ; Jou, J.-Y.
Author_Institution :
AT&T Bell Labs., Allentown, PA, USA
Abstract :
The authors present a simulation-based system for testing high-level behavioral synthesis tools. Applications are tool debugging and automatic regression test. A key feature is a transformation of sequential circuits for application of random test patterns
Keywords :
C language; automatic test equipment; digital simulation; logic testing; program debugging; random processes; sequential circuits; software tools; C language; debugging; high-level behavioral synthesis tools; random test patterns; regression test; test system generator; transformation of sequential circuits; Automatic testing; Circuit simulation; Circuit synthesis; Circuit testing; Debugging; Driver circuits; Hardware; Monitoring; Signal synthesis; System testing;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82389
