Title :
How much fault coverage is enough?
Author_Institution :
NCR Corp., Wichita, KS, USA
Abstract :
The author shows how to determine the stuck-fault coverage requirement for an application-specific integrated circuit (ASIC) using a total cost-of-ownership model. The cost-of-ownership model has been used to arrive at the maximum tolerable defect level under a certain set of conditions. The cost-of-ownership model also reveals that device problems not detected by stuck-fault tests will eventually dominate cost of ownership as stuck faults are removed. It is noted that for certain typical conditions the economic level of fault coverage is essentially 100%
Keywords :
VLSI; application specific integrated circuits; economics; fault location; integrated circuit testing; ASIC; IC testing; VLSI; application-specific integrated circuit; cost; economics; logic testing; stuck-fault coverage; Application specific integrated circuits; Automatic testing; Circuit faults; Circuit testing; Costs; Fault detection; Integrated circuit modeling; Integrated circuit technology; Integrated circuit testing; Logic testing;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82391
