Title :
Fault diagnosis based on post-test fault dictionary generation
Author :
Kato, Junko ; Shimono, Takeshi ; Kawai, Masato
Author_Institution :
NEC Corp., Tokyo, Japan
Abstract :
A practical approach to fault diagnosis based on posttest fault dictionary generation is presented. Computer resources which are needed to generate a fault dictionary can be reduced drastically by utilizing the error symptoms obtained from go/no-go test execution. The approach has been applied to several circuits, and the results are very promising
Keywords :
VLSI; automatic testing; electronic engineering computing; fault location; integrated circuit testing; IC testing; VLSI; automatic testing; error symptoms; fault diagnosis; go/no-go test; post-test fault dictionary generation; Circuit faults; Circuit testing; Computer errors; Dictionaries; Error probability; Fault detection; Fault diagnosis; Fault location; Pins; Very large scale integration;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82392
