Title :
Program/pattern interface for silicon debug on a VLSI test system
Author :
Moran, Larry ; Ritter, Terry
Author_Institution :
Teradyne Inc., Agoura Hills, CA, USA
Abstract :
A software tool called sd953 was created to help integrate design and testing in the area of silicon debugging. sd953 was developed on a VLSI test system to aid in silicon debugging of a complex 32-bit microprocessor. sd953 correlates design simulation files with device test vectors and provides the design engineer with a highly interactive display interface. The cross-referencing between the failing VLSI test system test vector and the original simulation data is accurate and practically instantaneous. sd953 can reduce the time to identify silicon defects from days to hours or even minutes
Keywords :
VLSI; automatic test equipment; automatic testing; circuit CAD; computer testing; elemental semiconductors; integrated circuit testing; microprocessor chips; silicon; software tools; user interfaces; 32 bit; ATE; Si debugging; VLSI test; cross-referencing; design simulation files; device test vectors; interactive display interface; microprocessor; program pattern interface; sd953; software tool; Computational modeling; Data engineering; Design engineering; Displays; Microprocessors; Region 2; Silicon; Software testing; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82393
