• DocumentCode
    1639720
  • Title

    Testing and testability of programmable logic devices

  • Author

    VanDerwiele, James M.

  • Author_Institution
    AT&T Network Syst., Oklahoma City, OK, USA
  • fYear
    1989
  • Firstpage
    944
  • Abstract
    The author emphasizes that it is critical that thorough testing of programmable logic devices be included in the manufacturing process. Part of this testing is often done in the in-circuit test environment. It is concluded that testability must be programmed into these parts for successful in-circuit testing
  • Keywords
    logic arrays; logic testing; production testing; in-circuit test environment; logic testing; production testing; programmable logic devices; testability; Assembly; Circuit testing; Cities and towns; Logic testing; Manufacturing processes; Performance evaluation; Printed circuits; Production facilities; Programmable logic devices; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/TEST.1989.82396
  • Filename
    82396
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1639720