Title :
Digitally-assisted sample-to-sample jitter correction in ADC systems
Author :
Oulmane, Mourad ; Roberts, Gordon W.
Author_Institution :
Integrated Microsyst. Lab., McGill Univ., Montreal, QC, Canada
Abstract :
In this paper we present a technique that permits the correction of errors caused by the timing jitter associated with sampling clocks cadencing analog-to-digital converters (ADCs). The correction system is digital, completely independent of the front-end ADC and corrects the data out of the converter on a sample-to-sample basis. Relative to the ADC under consideration, the proposed technique enables quasi-zero jitter sampling characteristics which is demonstrated experimentally in this paper.
Keywords :
analogue-digital conversion; clocks; integrated circuit noise; timing jitter; ADC system; analog-to-digital converter; digital correction system; digitally-assisted sample-to-sample jitter correction; error correction; front-end ADC; quasizero jitter sampling; sample-to-sample basis; sampling clock; timing jitter; Clocks; Equations; Finite impulse response filter; Jitter; Mathematical model; Phase locked loops; Signal resolution;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
DOI :
10.1109/ICSICT.2010.5667745
