Title :
Model engineering curricula for `meeting the tests of time´
Author :
Absher, Richard ; Lecky, J. E Ned
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Vermont Univ., Burlington, VT, USA
Abstract :
A curriculum in electronics test engineering is outlined. Typical program requirements are presented
Keywords :
educational courses; electrical engineering; electronic equipment testing; curriculum; electronics test engineering; undergraduate level; Circuit testing; Computer science; Design engineering; Electrical engineering; Electronic equipment testing; Macroeconomics; Mathematics; Microeconomics; Programming; Reliability engineering;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82400
