DocumentCode
1639827
Title
Model engineering curricula for `meeting the tests of time´
Author
Absher, Richard ; Lecky, J. E Ned
Author_Institution
Dept. of Comput. Sci. & Electr. Eng., Vermont Univ., Burlington, VT, USA
fYear
1989
Firstpage
949
Abstract
A curriculum in electronics test engineering is outlined. Typical program requirements are presented
Keywords
educational courses; electrical engineering; electronic equipment testing; curriculum; electronics test engineering; undergraduate level; Circuit testing; Computer science; Design engineering; Electrical engineering; Electronic equipment testing; Macroeconomics; Mathematics; Microeconomics; Programming; Reliability engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location
Washington, DC
Type
conf
DOI
10.1109/TEST.1989.82400
Filename
82400
Link To Document