A military test method for measuring fault coverage

Author

Debany, Warren H., Jr.

Author_Institution

US Air Force Rome Air Dev. Center, Griffiss AFB, NY, USA

fYear

1989

Firstpage

951

Abstract

Proposed MIL-STD-883 Test Procedure 5012, `Fault Coverage Measurement for Digital Microcircuits´, is described. Numerous fault simulation tools are commercially available; this procedure provides a means of obtaining consistent and repeatable fault coverage values from different fault simulators. The procedure describes requirements governing the development of the logic model for the IC, the assumed fault model and fault universe, fault classing, fault simulation, and fault coverage reporting. It provides a consistent means of reporting fault coverage for an IC regardless of the specific logic and fault simulator used

Keywords

automatic testing; digital integrated circuits; digital simulation; fault location; logic testing; measurement standards; military equipment; MIL-STD-883 Test Procedure 5012; digital microcircuits; fault classing; fault coverage; fault model; fault simulation tools; fault universe; logic model; military test; Circuit faults; Circuit simulation; Circuit testing; Integrated circuit manufacture; Integrated circuit modeling; Integrated circuit testing; Logic testing; Manufacturing; Programmable logic arrays; Qualifications;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1989. Proceedings. Meeting the Tests of Time., International

Conference_Location

Washington, DC

Type

conf

DOI

10.1109/TEST.1989.82402

Filename

82402