DocumentCode
1640123
Title
Experimental Methods in Air Cooling of Electronics
Author
Moffat, Robert J. ; Ortega, Alfonso
Author_Institution
Stanford University
fYear
1997
Keywords
Electrical resistance measurement; Electronic components; Electronics cooling; Error analysis; Heat transfer; Infrared detectors; Mechanical engineering; Temperature; Thermal resistance; Turbines;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1997. SEMI-THERM XIII., Thirteenth Annual IEEE
ISSN
1065-2221
Print_ISBN
0-7803-3793-X
Type
conf
DOI
10.1109/STHERM.1997.566776
Filename
566776
Link To Document