Title :
Experimental Methods in Air Cooling of Electronics
Author :
Moffat, Robert J. ; Ortega, Alfonso
Author_Institution :
Stanford University
Keywords :
Electrical resistance measurement; Electronic components; Electronics cooling; Error analysis; Heat transfer; Infrared detectors; Mechanical engineering; Temperature; Thermal resistance; Turbines;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1997. SEMI-THERM XIII., Thirteenth Annual IEEE
Print_ISBN :
0-7803-3793-X
DOI :
10.1109/STHERM.1997.566776
