Title :
Flicker-noise as measure of reliability of radio electronic devices
Author :
Kolodiy, Zenoviy
Author_Institution :
Inst. of Telecommun., Radioelectron. & Electron. Tech., Lviv Polytech. Nat. Univ., Lviv, Ukraine
Abstract :
It is proposed to use flicker -noise of electronic elements for diagnosing of their inner structure.
Keywords :
flicker noise; radiofrequency interference; semiconductor device noise; semiconductor device reliability; electronic elements; flicker noise; inner structure diagnosis; radio electronic devices; reliability measure; flicker-noise; inner structure; system relaxation time;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2008 Proceedings of International Conference on
Conference_Location :
Lviv-Slavsko
Print_ISBN :
978-966-553-678-9
