DocumentCode :
1640220
Title :
Practical considerations in benchmarking digital testing systems
Author :
Mourad, Samiha
Author_Institution :
Santa Clara Univ., CA, USA
fYear :
1989
Firstpage :
952
Abstract :
It is noted that there are minimum requirements benchmark circuits have to satisfy in order to be useful in evaluating digital testing systems (DTSs). The circuits need to have a profile that enables the testing to be done in an efficient way. The circuits also need to include commonly used constructs such as bidirectional pins or asynchronous signals. Also, the correctness of different versions of the same circuit needs to be verified in order to make a fair comparison of the different DTSs. The author aims to determine the features that have to be known about the benchmark circuits before using them to evaluate DTSs, to distinguish between the requirements for combinational and sequential circuits, and to show the merit of using a neutral hardware description language to facilitate the transport of the circuits between DTSs
Keywords :
automatic test equipment; automatic testing; logic testing; performance evaluation; asynchronous signals; benchmark circuits; benchmarking; bidirectional pins; combinatorial circuits; digital testing; digital testing systems; neutral hardware description language; sequential circuits; transportability; Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Hardware design languages; Logic testing; Sequential analysis; Sequential circuits; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/TEST.1989.82403
Filename :
82403
Link To Document :
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