Multichannel tensometric Si, Six-Ge1-x based system

The optimal method to measure strain of the sample is to use strain gauges based on the semiconductor microcrystals. Sensors on the basis of Si, Si_xGe_1-x whiskers are one of the best for such measurements due to their high gauge factor and great mechanical strength. Characteristics of strain gauges based on Si whiskers were measured in the wide strain and temperature ranges. Nevertheless few problems still remain, meanly the thermal dependence of resistance and nonlinearity. These problems were solved by digital signal processing. The system for signal processing with microcontroller and special program was developed. The system could be connected with computer. Received data are stored in the file on hard disk drive.