Title :
Achieving ATE accuracy at gigahertz test rates: comparison of electronic and electrooptic sampling technologies
Author :
Henley, Francois J. ; Choi, Hee-June
Author_Institution :
Photon Dynamics Inc., San Jose, CA, USA
Abstract :
Testing devices at clock rates exceeding 50 MHz with waveform resolution below 100 ps necessitates the use of sampling methods. The current state of the art includes two radically different sampling technologies: electronic sampling (ES) utilizing a diode bridge structure and a novel electrooptic sampling (EOS) technology which uses short light pulses as the time-resolving element. The bandwidth, loading, and time/voltage accuracy of these two technologies are compared for fitness of use in a gigahertz ATE (automatic test equipment) environment. It is noted that the analysis of these two techniques quantifies the electrooptic technology´s time accuracy advantages due to its low loading and short DUT (device under test)/sensor distances
Keywords :
automatic test equipment; automatic testing; computerised signal processing; digital integrated circuits; integrated circuit testing; logic testing; 500 MHz; ATE; DUT sensor distance; GHz; bandwidth; clock rates; diode bridge; electronic sampling; electrooptic sampling; gigahertz; light pulses; loading; time-resolving; time/voltage accuracy; Automatic test equipment; Bandwidth; Bridge circuits; Clocks; Diodes; Earth Observing System; Electrooptic devices; Sampling methods; Testing; Voltage;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82404
