• DocumentCode
    1640558
  • Title

    Digital background calibration of MDAC stage gain error and DAC error in pipelined ADC

  • Author

    Zhang, Shuying ; Ding, Ling ; Xu, Jiajing ; Zhang, Fuquan ; Wang, Shuai ; Chang, Yuchun

  • Author_Institution
    State Key Lab. on Integrated Optoelectron., Jilin Univ., Changchun, China
  • fYear
    2010
  • Firstpage
    251
  • Lastpage
    253
  • Abstract
    A simple digital background-calibration technique is proposed for a pipelined analog-to-digital converter (ADC). Both gain error and DAC error are measured and calibrated by injecting two uncorrelated pseudo-random sequences into the MDAC. With this method, not only small capacitors might be used, leading to small chip size, but also the traditional current starving high gain op-amps of pipelined ADC could be replaced by low gain low power counterparts, which results in improving the figure-of-merit (FOM) significantly. A 12-bit 100MS/s pipelined ADC achieves 11.934 bits ENOB and 101.22dB SFDR, compared with 7.685 bits and 50.95dB without calibration.
  • Keywords
    analogue-digital conversion; digital-analogue conversion; operational amplifiers; DAC error; MDAC stage gain error; digital background calibration; high gain op-amps; pipelined ADC; pipelined analog-to-digital converter; pseudo-random sequences; simple digital background-calibration; Calibration; Capacitors; Conferences; Equations; Mathematical model; Simulation; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-5797-7
  • Type

    conf

  • DOI
    10.1109/ICSICT.2010.5667773
  • Filename
    5667773