Title :
Digital background calibration of MDAC stage gain error and DAC error in pipelined ADC
Author :
Zhang, Shuying ; Ding, Ling ; Xu, Jiajing ; Zhang, Fuquan ; Wang, Shuai ; Chang, Yuchun
Author_Institution :
State Key Lab. on Integrated Optoelectron., Jilin Univ., Changchun, China
Abstract :
A simple digital background-calibration technique is proposed for a pipelined analog-to-digital converter (ADC). Both gain error and DAC error are measured and calibrated by injecting two uncorrelated pseudo-random sequences into the MDAC. With this method, not only small capacitors might be used, leading to small chip size, but also the traditional current starving high gain op-amps of pipelined ADC could be replaced by low gain low power counterparts, which results in improving the figure-of-merit (FOM) significantly. A 12-bit 100MS/s pipelined ADC achieves 11.934 bits ENOB and 101.22dB SFDR, compared with 7.685 bits and 50.95dB without calibration.
Keywords :
analogue-digital conversion; digital-analogue conversion; operational amplifiers; DAC error; MDAC stage gain error; digital background calibration; high gain op-amps; pipelined ADC; pipelined analog-to-digital converter; pseudo-random sequences; simple digital background-calibration; Calibration; Capacitors; Conferences; Equations; Mathematical model; Simulation; Solid state circuits;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
DOI :
10.1109/ICSICT.2010.5667773